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X-ray Phase Contrast Imaging

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SKU: 9781908977311

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Description

This book fills an important gap in the existing literature by providing a comprehensive discussion of X-ray Phase Contrast Imaging (XPCi) and its various uses and implementations. XPCi could revolutionise all applications of X-ray imaging. It exploits a different mechanism to generate image contrast (refraction/interference instead of absorption), thus enhancing the visibility of all details, allowing the detection of features that are classically considered invisible.XPCi emerged in the mid-1990s, primarily at synchrotron radiation facilities. Initially, its use was considered to be very restricted due to the stringent requirements imposed on the radiation source. New methods which allow XPCi to be used with conventional X-ray sources have recently emerged, thus providing concrete possibilities for transfer into mainstream applications. This has renewed enthusiasm in the field and spawned a large number of new research groups worldwide.This book follows a historical perspective and describes all possible implementations of XPCi. In each case, the underpinning theory is described, the possible experimental realisations are discussed and the targeted applications listed, with specific mentions of the most significant examples. Although sometimes overlooked, X-ray imaging is all-pervasive in our society: medicine, industrial scans, non-destructive testing, security inspections and a vast number of scientific fields rely heavily on it. Hence, the potential impact of XPCi is immense.Table of ContentTranslation from Optical Methods: The Early Experiments; Free-Space Propagation at Synchrotrons and with Microfocal Sources, First Attempts at Quantitative Phase Retrieval; Crystal-Based Methods: Analyzer-Based Imaging, Diffraction Enhanced Imaging (DEI), Bonse/Hart Interferometry; Phase Retrieval Approaches in Crystal-based Methods: Extended and Generalized DEI, Multiple Image Radiology, Gaussian and Lorentzian Fitting; Grating-Based Methods: Talbot Interferometers, Talbot/Lau Interferometers, Moire Methods, Edge Illumination and Coded Apertures; Quantitative Approaches to Grating-Based Methods: Phase-Stepping, Processing of Symmetric Images, Fourier-Based Analysis and Single-Shot Methods; The Evolution of 3D Methods, Holotomoraphy, Current 3D Implementation and Quantitative Electron Density Reconstruction; The Latest Developments and Outlook, Particularly Contrast Enhancement, Coherent Diffraction Imaging Ptychography and Any Other Salient Aspects which Arise in the Near Future.

Specifications

ISBN-13
9781908977311
Author
Peter R T Munro
Publisher
Imperial College Press
Publication Date
2025-02-28
Binding
hardcover
Condition
new
Pages
220
Language
english
Country of Origin
United States
Weight (g)
400
Height (mm)
30
Length (mm)
198
Width (mm)
132

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